The Utility Value of High Voltage Electron Microscopy for X-Ray Microanalysis

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...

X-ray microanalysis attachment for electron microscope.

Electron probe X-ray microanalysis of cultured epithelial tumour cells with scanning electron microscopy.

Three methods have been used to prepare cultured cells for electron probe X-ray microanalysis (EPXMA): (1) analysis at the subcellular level of freeze-dried ultrathin cryosections with scanning transmission electron microscopy (STEM); (2) analysis at the cellular level of whole freeze-dried cells with STEM; and (3) analysis at the cellular level of whole freeze-dried cells with scanning electro...

the plain x-ray the diagnosis of the acute abdomen_

چکیده ندارد.

scanning electron microscopy and energy-dispersive x-ray microanalysis of set cem cement after application of different bleaching agents

introduction: the present study evaluated the element distribution in completely set calcium-enriched mixture (cem) cement after application of 35% carbamide peroxide, 40% hydrogen peroxide and sodium perborate as commercial bleaching agents using an energy-dispersive x-ray microanalysis (edx) system. the surface structure was also observed using the scanning electron microscope (sem). methods ...